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Proceedings International Test Conference 1992 (1992)
Baltimore, MD, USA
Sept. 20, 1995 to Sept. 24, 1995
ISSN: 1089-3539
ISBN: 0-7803-0760-7
TABLE OF CONTENTS

Delay Test: The Next Frontier for LSSD Test Systems (PDF)

T. Williams , IBM Boulder, USA
B. Konemann , IBM Poughkeepsie, NY, USA
P. Chang , IBM Endicott, USA
V. Iyengar , IBM Yorktown, USA
B. Rosen , IBM Yorktown, USA
J. Barlow , IBM Endicott, USA
R. Gabrielson , IBM Endicott, USA
C. Goertz , IBM Endicott, USA
B. Keller , IBM Endicott, USA
K. McCauley , IBM Endicott, USA
J. Tischer , IBM Endicott, USA
pp. 578

Author index (PDF)

pp. 1009
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