The Community for Technology Leaders
2017 IEEE 17th International Working Conference on Source Code Analysis and Manipulation (SCAM) (2017)
Shanghai, China
Sept. 17, 2017 to Sept. 18, 2017
ISSN: 2470-6892
ISBN: 978-1-5386-3238-3
TABLE OF CONTENTS

[Title page iii] (PDF)

pp. iii

Table of contents (PDF)

pp. v-vi

Program Committee (PDF)

pp. ix-x

Keynotes (PDF)

pp. xi-xii

Author index (PDF)

pp. 165
102 ms
(Ver 3.3 (11022016))