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Issue No. 02 - March/April (vol. 7)
ISSN: 1521-9615
From the Editor
Cluster Computing

Guest Editors' Introduction: Cluster Computing (HTML)

George K. Thiruvathukal , Loyola University Chicago
pp. 11-13

Plug-and-Play Cluster Computing: High-Performance Computing for the Mainstream (Abstract)

Dean E. Dauger , Dauger Research
Viktor K. Decyk , University of California, Los Angeles
pp. 27-33

Cluster Computing with Java (Abstract)

Philip Hatcher , University of New Hampshire, Durham
Mathew Reno , University of New Hampshire, Durham
Gabriel Antoniu , IRISA?INRIA Research Center, France
Luc Boug? , ?cole Normale Sup?rieure of Cachan, France
pp. 34-39

Resource-Aware Scientific Computation on a Heterogeneous Cluster (Abstract)

James D. Teresco , Williams College
Jamal Faik , Rensselaer Polytechnic Institute
Joseph E. Flaherty , Rensselaer Polytechnic Institute
pp. 40-50
Perspectives in Computational Science

High-Performance Computing: Clusters, Constellations, MPPs, and Future Directions (Abstract)

Jack Dongarra , Oak Ridge National Laboratory
Thomas Sterling , California Institute of Technology
Horst Simon , Lawrence Berkeley National Laboratory
Erich Strohmaier , Lawrence Berkeley National Laboratory
pp. 51-59
Your Homework Assignment

Blind Deconvolution: A Matter of Norm (Abstract)

Dianne P. O'Leary , University of Maryland
pp. 60-66
Scientific Programming

Global E-Science Collaboration (Abstract)

Gigi Karmous-Edwards , Advanced Technology Group at MCNC Grid Computing and Network Services
pp. 67-74
Visualization Corner

A Virtual Laboratory for Temporal Bone Microanatomy (Abstract)

Pei-Dong Dai , Eye and ENT Hospital, Fudan University, China
Tian-Yu Zhang , Eye and ENT Hospital, Fudan University, China
Zheng-Min Wang , Eye and ENT Hospital, Fudan University, China
Jim X. Chen , George Mason University
Ke-Qiang Wang , Zhongshan Hospital, Fudan University, China
pp. 75-79

The Fast Fourier Transform for Experimentalists, Part I: Concepts (Abstract)

Denis Donnelly , Siena College
Bert Rust , National Institute for Standards and Technology
pp. 80-88
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