Low power compression of incompatible test cubes

D. Czysz; G. Mrugalski; N. Mukherjee; J. Rajski; P. Szczerbicki; J. Tyszer

doi:10.1109/TEST.2010.5699274

2010 IEEE International Test Conference

Low power compression of incompatible test cubes

Year: 2010, Pages: 1-10

DOI Bookmark: 10.1109/TEST.2010.5699274

Authors

D. Czysz, Mentor Graphics Corporation, Wilsonville, OR 97070, USA
G. Mrugalski, Mentor Graphics Corporation, Wilsonville, OR 97070, USA
N. Mukherjee, Mentor Graphics Corporation, Wilsonville, OR 97070, USA
J. Rajski, Mentor Graphics Corporation, Wilsonville, OR 97070, USA
P. Szczerbicki, Poznan University of Technology, 60-965, Poland
J. Tyszer, Poznan University of Technology, 60-965, Poland

Abstract

The paper presents a new power-aware test scheme compatible with a newly proposed test compression environment based on deterministic clustering of test cubes with conflicts. The key contribution is a flexible test application framework that achieves significant reductions in switching activity during scan loading by means of a tri-modal test data decompressor.

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Low power compression of incompatible test cubes

Authors

Abstract

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