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October-December 2003(Vol. 2, No. 4)   pp. 314-321
Power Bus Signal Integrity Improvement and EMI Mitigation on Multilayer High-Speed Digital PCBs with Embedded Capacitance

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TMC.2003.1255646
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Abstract

Abstract—The continuous technology trend in the telecommunication market toward higher operating frequencies and high processing performances will give rise to new sophisticated chip sets, processors, and RF transceivers which will demand new features to the PCB designs. As the complexity of the integrated circuits increases, Signal Integrity (SI) and ElectroMagnetic Compatibility (EMC) become key elements in the board design process. This paper analyzes the beneficial effects that a thin dielectric material between a pair of power and ground layers (embedded capacitance) has both in reducing power bus resonance amplitudes (SI approach) and radiated emissions (EMC approach) as well. Scattering parameter measurements carried out on the power bus of two production boards are presented and correlated with the electric field strength measurements conducted on the same boards in a semianechoic chamber.

References
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[2] B.R. Archambeault, PCB Design for Real-World EMI Control. Boston: Kluwer, 2002.
[3] X. Ye, D.M. Hockanson, M. Li, Y. Ren, W. Cui, J.L. Drewniak, and R.E. DuBroff, EMI Mitigation with Multilayer Power-Bus Stacks and via Stitching of Reference Planes IEEE Trans. Electromagnetic Compatability, vol. 43, no. 4, Nov. 2001.
[4] V. Ricchiuti, A. Orlandi, and G. Antonini, Buried Capacitance Technology for Power Bus Decoupling on High Speed Digital PCB's Proc. 14th Int'l Zurich Symp. Electromagnetic Compatibility, 2001.
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[7] M. Leone and L. Jung, Quantification of the Radiation Level of Power-Bus Structures on Printed Circuit Boards Proc. EMC Europe 2002 Symp., pp. 317-321, Sept. 2002.
[8] V. Ricchiuti, A. Orlandi, G. Antonini, and P. Illuminati, Effects of Power Bus Stitching on Signal Integrity and Thermal Analysis Proc. 2003 IEEE Int'l Symp. EMC, 2003.
[9] D.A. Frickey, Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances IEEE Trans. Microwave Theory Technology, vol. 42, no. 2, pp. 205-211, Feb. 1994.
[10] H. Shi, F. Sha, J.L. Drewniak, T.P. Van Doren, and J.H. Hubing, An Experimental Procedure for Characterizing Interconnects to the DC Power Bus on a Multilayer Printed Circuit Board IEEE Trans. EMC, vol. 39, pp. 279-285, Nov. 1997.
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[12] Computer Simulation Tech nology, CST Microwave Studio Manual, vol. I-II, 2003, www.cst.del.
Additional Information
Index Terms- Embedded capacitance, power bus, power/ground layers, power supply decoupling, S-parameters, electric field strength.

Citation:  Vittorio Ricchiuti, "Power Bus Signal Integrity Improvement and EMI Mitigation on Multilayer High-Speed Digital PCBs with Embedded Capacitance," IEEE Transactions on Mobile Computing, vol. 2,  no. 4,  pp. 314-321,  Oct-Dec,  2003

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