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Published Articles >> Table of Contents >> Abstract
January 2004 - (Vol. 53, No. 1)
pp. 83-88
Masking of Unknown Output Values during Output Response Compression byUsing Comparison Units
Irith Pomeranz, IEEE
Sandip Kundu, IEEE
Sudhakar M. Reddy, IEEE
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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TC.2004.1255794
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| Abstract |
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A circuit may produce unknown output values during simulation of a test set, e.g., due to an unknown initial state or due to the existence of tristate elements. Unknown output values in the output response of a circuit make it impossible to determine a single unique signature for the fault-free circuit when built-in self-test is used for testing the circuit. We consider the problem of synthesizing a logic block that replaces unknown output values in the output response of a circuit with a known constant. The logic block is constructed from building blocks called comparison units. The synthesis procedure ensures that the built-in self-test scheme will be able to detect all the faults detectable by the test set applied to the circuit while allowing a single unique signature to be computed. Two variations of the synthesis procedure are considered, a two-dimensional version suitable for synchronous sequential circuits without scan and for scan circuits with multiple scan chains and a one-dimensional version suitable for scan circuits with a single scan chain.
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 References
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 Additional Information
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Index Terms- Built-in self-test, output response compression, scan design.
Citation:
Irith Pomeranz, Sandip Kundu, Sudhakar M. Reddy,
"Masking of Unknown Output Values during Output Response Compression byUsing Comparison Units,"
IEEE Transactions on Computers,
vol. 53,
no. 1,
pp. 83-88,
Jan.,
2004
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