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Proceedings
WSE
WSE 2004
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Proceedings. Sixth IEEE International Workshop on Web Site Evolution
Sept. 11 2004 to Sept. 11 2004
Chicago, IL, USA
Table of Contents
Proceedings. Sixth IEEE International Workshop on Web Site Evolution
Freely available from IEEE.
pp. i
Table of contents
Freely available from IEEE.
pp. v
Welcome from the Workshop Chairs
Freely available from IEEE.
pp. vi-vii
Acknowledgements
Freely available from IEEE.
pp. ix-ix
Workshop Committee
Freely available from IEEE.
pp. viii
Technical Session 1
Testing a Web application
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pp. 3-10
by
H.M. Sneed
Technical Session 1
A 2-layer model for the white-box testing of Web applications
Full-text access may be available. Sign in or learn about subscription options.
pp. 11-19
by
P. Tonella
,
F. Ricca
Technical Session 1
Observations on the implementation and testing of scripted Web applications
Full-text access may be available. Sign in or learn about subscription options.
pp. 20-27
by
S. Bedi
,
P.J. Schroeder
Technical Session 2
Web site evolution via transaction reengineering
Full-text access may be available. Sign in or learn about subscription options.
pp. 31-40
by
S. Tilley
,
D. Distante
,
Shihong Huang
Technical Session 2
Legal concerns of Web site reverse engineering
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pp. 41-50
by
H.M. Kienle
,
D. German
,
H. Muller
Technical Session 2
Creating effective load models for performance testing with incomplete empirical data
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pp. 51-59
by
S. Barber
Technical Session 3
PAWA: a program analysis tool for Web based intranet applications
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pp. 63-70
by
M. Sagoo
,
M. Capretz
,
J. Samarabandu
Technical Session 3
Identifying cross site scripting vulnerabilities in Web applications
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pp. 71-80
by
G.A. Di Lucca
,
A.R. Fasolino
,
M. Mastoianni
,
P. Tramontana
Invited Address and Panel
Web application testing beyond tactics
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pp. 83
by
Hung Quoc Nguyen
Invited Address and Panel
Research challenges in testing web applications
Freely available from IEEE.
pp. 84-84
by
C. Kaner
,
S. Tilley
,
H.M. Sneed
,
P. Zimmerer
Invited Address and Panel
Author index
Freely available from IEEE.
pp. 85
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