Default Cover Image

Proceedings. Sixth IEEE International Workshop on Web Site Evolution

Sept. 11 2004 to Sept. 11 2004

Chicago, IL, USA

Table of Contents

Table of contentsFreely available from IEEE.pp. v
Welcome from the Workshop ChairsFreely available from IEEE.pp. vi-vii
AcknowledgementsFreely available from IEEE.pp. ix-ix
Workshop CommitteeFreely available from IEEE.pp. viii
Technical Session 1
Testing a Web applicationFull-text access may be available. Sign in or learn about subscription options.pp. 3-10
Technical Session 1
A 2-layer model for the white-box testing of Web applicationsFull-text access may be available. Sign in or learn about subscription options.pp. 11-19
Technical Session 1
Observations on the implementation and testing of scripted Web applicationsFull-text access may be available. Sign in or learn about subscription options.pp. 20-27
Technical Session 2
Web site evolution via transaction reengineeringFull-text access may be available. Sign in or learn about subscription options.pp. 31-40
Technical Session 2
Legal concerns of Web site reverse engineeringFull-text access may be available. Sign in or learn about subscription options.pp. 41-50
Technical Session 2
Creating effective load models for performance testing with incomplete empirical dataFull-text access may be available. Sign in or learn about subscription options.pp. 51-59
Technical Session 3
PAWA: a program analysis tool for Web based intranet applicationsFull-text access may be available. Sign in or learn about subscription options.pp. 63-70
Technical Session 3
Identifying cross site scripting vulnerabilities in Web applicationsFull-text access may be available. Sign in or learn about subscription options.pp. 71-80
Invited Address and Panel
Web application testing beyond tacticsFull-text access may be available. Sign in or learn about subscription options.pp. 83
Invited Address and Panel
Research challenges in testing web applicationsFreely available from IEEE.pp. 84-84
Invited Address and Panel
Author indexFreely available from IEEE.pp. 85
Showing 16 out of 16