|
Published Articles >> Table of Contents >> Abstract
22nd IEEE VLSI Test Symposium
p. 319
Cost-Driven Selection of Parity Trees
Sobeeh Almukhaizim, Yale University, New Haven, CT
Petros Drineas, Rensselaer Polytechnic Institute, Troy, NY
Yiorgos Makris, Yale University, New Haven, CT
Full Article Text:
  
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299259
Send link to a friend
| Abstract |
|
We discuss the problem of parity tree selection for lossless compaction of the output responses of a circuit. Earlier methods assume off-chip storage of the correct compacted responses and therefore minimize the number of necessary parity trees. In contrast, our method targets on-chip generation of the correct compacted responses and therefore minimizes the actual implementation cost of the corresponding parity prediction functions. We present a systematic search approach that exploits the correlation between the hardware cost of a function and its entropy, in order to select parity trees that minimize the incurred cost, while achieving lossless compaction. Experimental results demonstrate that our method achieves significant hardware reduction over methods that minimize the number of parity trees.
|
 Additional Information
|
Citation:
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris,
"Cost-Driven Selection of Parity Trees,"
vts,
p. 319,
22nd IEEE VLSI Test Symposium,
2004
|
|
