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Published Articles >> Table of Contents >> Abstract
22nd IEEE VLSI Test Symposium
p. 154
A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs
Mehdi B. Tahoori, Northeastern University, Boston, MA
Edward J. McCluskey, Stanford University, CA
Michel Renovell, LIRMM, France
Philippe Faure, LIRMM, France
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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299239
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| Abstract |
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An Application-Dependent test strategy to be used by an FPGA user is presented which requires only 3 test configurations. In this specific strategy, the interconnect is first tested by modifying the logic block configuration and preserving the interconnect configuration. Then, the used logic blocks are fully tested by modifying the interconnect configuration. Results for some benchmark applications mapped into the Xilinx FPGAs are also provided.
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 Additional Information
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Citation:
Mehdi B. Tahoori, Edward J. McCluskey, Michel Renovell, Philippe Faure,
"A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs,"
vts,
p. 154,
22nd IEEE VLSI Test Symposium,
2004
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