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22nd IEEE VLSI Test Symposium   p. 73
Changing the Scan Enable during Shift
Nodari Sitchinava, Synopsys Inc., Mountain View, CA
Samitha Samaranayake, Massachusetts Institute of Technology, Cambridge, MA
Rohit Kapur, Synopsys Inc., Mountain View, CA
Emil Gizdarski, Synopsys Inc., Mountain View, CA
Fredric Neuveux, Synopsys Inc., Mountain View, CA
T. W. Williams, Synopsys Inc., Mountain View, CA

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299228
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Abstract
This paper extends the Reconfigurable Shared Scan-in architecture (RSSA) to provide additional ability to change values on the scan configuration signals (scan enable signals) during the scan operation on a per-shift basis. We show that the extra flexibility of reconfiguring the scan chains every shift cycle reduces the number of different configurations required by RSSA while keeping test coverage the same. In addition a simpler analysis can be used to construct the scan chains. This is the first paper of its kind that treats the Scan Enable signal as a test data signal during the scan operation of a test pattern. Results are presented on some ISCAS as well as industrial circuits.
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Citation:  Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Fredric Neuveux, T. W. Williams, "Changing the Scan Enable during Shift," vts, p. 73,  22nd IEEE VLSI Test Symposium,  2004