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21st IEEE VLSI Test Symposium   p. 77
Ultra Low Cost Analog BIST Using Spectral Analysis
Marcelo Negreiros, Universidade Federal do Rio Grande do Sul - UFRGS
Luigi Carro, Universidade Federal do Rio Grande do Sul - UFRGS
Altamiro Amadeu Susin, Universidade Federal do Rio Grande do Sul - UFRGS

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197636
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Abstract
In this work a low cost method to implement an analog BIST scheme for the System on Chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practica results illustrating limitations and advantages of the proposed technique.
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Citation:  Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, "Ultra Low Cost Analog BIST Using Spectral Analysis," vts, p. 77,  21st IEEE VLSI Test Symposium,  2003