Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146)
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Abstract

This paper presents an approach for the maximal diagnosis of all faults (stuck-at, open and short) in the interconnect of a random access memory (RAM); the interconnect includes data and address lines. This approach accomplishes maximal diagnosis under a complex model in which the lines in the interconnect of the RAM are involved in multiple faults simultaneously. The proposed algorithm (referred to as the Improved Maximal Diagnosis Algorithm, or IMDA) requires maxfn,m-1g+n+3 WRITE and maxfn,mg+2n READ, where n is the number of address lines and m is the number of data lines.
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