An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

P. Nigh; W. Needham; K. Butler; P. Maxwell; R. Aitken

doi:10.1109/VTEST.1997.600334

Previous
Next
Table of Contents

Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125)

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

Year: 1997, Pages: 459

DOI Bookmark: 10.1109/VTEST.1997.600334

Authors

P. Nigh, IBM
W. Needham, IBM
K. Butler, IBM
P. Maxwell, IBM
R. Aitken, IBM

Abstract

This paper describes an experiment in which various semiconductor test methodologies (stuck-fault, functional, delay and IDDq) are applied to an ASIC device. The goal of this project is to provide the data that will enable manufacturers to optimize their application of the various tests. This project was supported through SEMATECH (Project S-121, "Semiconductor Test Method Evaluation ").

Like what you’re reading?

Already a member?

Get this article FREE with a new membership!