Proceedings 13th IEEE VLSI Test Symposium
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Abstract

Abstract: A Design-for-Test (DfT) methodology is proposed to perform an analysis of the dynamic supply current consumption as a testing methodology for continuous time filters. A built-in current sensor has been developed to analyze the dynamic current and a partitioning methodology, based on this sensor, has been developed to improve test reliability on large circuits under test. The DfT proposal allows one to use a conventional digital automatic test equipment (ATE) on this analog circuit type. Some experimental results are reported to illustrate the proposed DfT method.
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