Self-test in a VCM driver chip

L. Sebaa; N. Gardner; R. Neidorff; R. Valley

doi:10.1109/VTEST.1995.512619

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Proceedings 13th IEEE VLSI Test Symposium

Self-test in a VCM driver chip

Year: 1995, Pages: 0066

DOI Bookmark: 10.1109/VTEST.1995.512619

Authors

L. Sebaa, Western Digital Corp., Irvine, CA, USA
N. Gardner, Western Digital Corp., Irvine, CA, USA
R. Neidorff, Western Digital Corp., Irvine, CA, USA
R. Valley, Western Digital Corp., Irvine, CA, USA

Abstract

Abstract: This paper describes a cost effective self-test mode in a complex mixed-signal device. The device under test (DUT) is a Voice-Coil Motor (VCM) H-bridge amplifier with an onchip 11-bit D/A converter. The self-test mode can be initiated at the chip, board and system levels of testing and troubleshooting. The added self-test circuitry does not induce any noticeable silicon overhead.

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