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XXI International Conference of the Chilean Computer Science Society (SCCC'01) p. 0095 Empirical Validation of Class Diagram Complexity Metrics Full Article Text:
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SCCC.2001.10008 Send link to a friend
Citation: "Empirical Validation of Class Diagram Complexity Metrics," sccc, p. 0095, XXI International Conference of the Chilean Computer Science Society (SCCC'01), 2001
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