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Memory Technology, Design and Testin, IEEE International Workshop on

Testing Carry Logic Modules of SRAM-based FPGAs

Year: 2001, Pages: 0091

Authors

Xiaoling Sun, University of Alberta  
Jian Xu, University of Alberta  
Pieter Trouborst, Nortel Networks

Abstract

Abstract: The carry logic module (CLM) is an integral part of a configurable logic block (CLB) in a Xilinx XC4000 field programmable gate array (FPGA). This paper addresses the testing issues of a CLM for the first time. The integrity of a CLM is validated by the integrity of all its components. It has been found that the minimum numbers of CLM test configurations (TCs) under single stuck-at, multiple stuck-at, and universal fault models are six, seven and eight respectively. A set of selection criteria was proposed to obtain the "best" of eight TCs, each contains a subset of six and seven TCs for the two stuck-at fault models. These CLM TCs can be extended to include the test of the whole CLB.