Published Articles >> Table of Contents >> Abstract

Ninth International Software Metrics Symposium (METRICS'03)   p. 98
When Can We Test Less?
Tim Menzies, West Virginia University
Justin Di Stefano, West Virginia University
Kareem Ammar, West Virginia University
Kenneth McGill, Goddard Space Flight Center
Pat Callis, Goddard Space Flight Center
Robert (Mike) Chapman, Galaxy Global Corporation
John Davis, DN American

Full Article Text:

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/METRIC.2003.1232459
Send link to a friend

Abstract
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some properties of an ideal defect detector and assess different methods of generating one. In the case study presented here, traditional methods of generating such detectors (e.g. reusing detectors from the literature, linear regression, model trees) were found to be inferior to those found via a PACE analysis.
Back to Top Additional Information
Citation:  Tim Menzies, Justin Di Stefano, Kareem Ammar, Kenneth McGill, Pat Callis, Robert (Mike) Chapman, John Davis, "When Can We Test Less?," metrics, p. 98,  Ninth International Software Metrics Symposium (METRICS'03),  2003