| Abstract |
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Partitioning and concurrent pseudo-exhaustive test scheme has been proposed as a powerful solution to very large scale integrated (VLSI) testing problem. Pseudo-exhaustive test methodology provides effective, 100% fault coverage for all testable stuck-at faults. After partitioning the ISCAS’85 benchmark circuits, results were processed and studied to develop a procedure for concurrent testing. Tools written in C/C++ to process benchmark circuits and to produce sets of primary outputs and partitioned points that can be tested concurrently were developed.
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 Additional Information
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Citation:
B. Shaer,
"Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits,"
isvlsi,
p. 289,
IEEE Computer Society Annual Symposium on VLSI Emerging Trends in VLSI Systems Design (ISVLSI'04),
2004
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