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14th International Symposium on Software Reliability Engineering   p. 237
Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction
Peter G. Bishop, Adelard and Centre for Software Reliability
Robin E. Bloomfield, Adelard and Centre for Software Reliability

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISSRE.2003.1251046
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Abstract
Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise naturally from the program structure. The log normal distribution presents a problem when used in reliability growth models as it is not mathematically tractable. However we demonstrate that a worst case bound can be estimated that is less pessimistic than our earlier worst case bound theory.
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Citation:  Peter G. Bishop, Robin E. Bloomfield, "Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction," issre, p. 237,  14th International Symposium on Software Reliability Engineering,  2003