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Published Articles >> Table of Contents >> Abstract
5th International Symposium on Quality Electronic Design (ISQED'04)
pp. 395-400
A Versatile High Speed Bit Error Rate Testing Scheme
Yongquan Fan, McGill University
Zeljko Zilic, McGill University
Man Wah Chiang, McGill University
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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2004.1283706
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| Abstract |
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The quality of a digital communication interface can be characterized by its bit error rate (BER) performance. To ensure the quality of the manufactured interface, it is critical to quickly and precisely test its BER behavior. Traditionally, BER is evaluated using software simulations, which are very time-consuming. Though there are some standalone BER test products, they are expensive and none of them includes channel emulators, which are essential to testing BER under the presence of noise. To overcome these problems, we present a versatile scheme for BER testing in FPGAs. This scheme consists of two intellectual property (IP) cores: the BER tester (BERT) core and the additive white Gaussian noise (AWGN) generator core. We demonstrate through case studies that the proposed solution exhibits advantages in speed and cost over existing solutions.
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Citation:
Yongquan Fan, Zeljko Zilic, Man Wah Chiang,
"A Versatile High Speed Bit Error Rate Testing Scheme,"
isqed,
pp. 395-400,
5th International Symposium on Quality Electronic Design (ISQED'04),
2004
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