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2002 IEEE International Conference on Computer Design (ICCD'02)   p. 273
On the Detectability of Parametric Faults in Analog Circuits
Jacob Savir, New Jersey Institute Of Technology
Zhen Guo, New Jersey Institute Of Technology

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.2002.1106781
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Abstract
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
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Citation:  Jacob Savir, Zhen Guo, "On the Detectability of Parametric Faults in Analog Circuits," iccd, p. 273,  2002 IEEE International Conference on Computer Design (ICCD'02),  2002