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Ninth Great Lakes Symposium on VLSI   p. 109
Pseudo-Exhaustive Testing of Sequential Circuits
Bassam Shaer, University of Minnesota
Sami A. Al-Arian, University of South Florida
David Landis, Pennsylvania State University

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/GLSV.1999.757388
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Abstract
A new sequential circuit partitioning algorithm is introduced which enhances pseudo-exhaustive testing. Our PIFAN algorithm is based on an analysis of Primary Input cones and FANout values. Results are presented which show that PIFAN offers significant reductions in hardware overhead and test time when compared to alternative partitioning algorithms.
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Citation:  Bassam Shaer, Sami A. Al-Arian, David Landis, "Pseudo-Exhaustive Testing of Sequential Circuits," glsvlsi, p. 109,  Ninth Great Lakes Symposium on VLSI,  1999