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Published Articles >> Table of Contents >> Abstract
12th Annual IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM'04)
pp. 176-185
Defect and Fault Tolerance of Reconfigurable Molecular Computing
Mehdi B. Tahoori, Northeastern University, Boston, MA
Subhasish Mitra, Intel Corporation, Sacramento, CA
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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/FCCM.2004.26
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| Abstract |
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Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of reconfigurable molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware. In this paper, we demonstrate how test and diagnosis techniques originally developed for FPGAs can be used in the context of molecular computing.
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 Additional Information
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Citation:
Mehdi B. Tahoori, Subhasish Mitra,
"Defect and Fault Tolerance of Reconfigurable Molecular Computing,"
fccm,
pp. 176-185,
12th Annual IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM'04),
2004
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