Abstract
Accurate and fast evaluation of substrate coupled noise has become a key-factor in today's mixed-signal RF IC design. In this work, we present efficient and closed-form analytical solutions for modeling substrate coupling in VLSI circuits. Using Maxwell's equations and the Green's theorem an integral equation for the extraction of substrate parasitic elements is developed. We utilize a fast-convergent Green's function in the integral equation. We also derive analytical solutions for the fourfold integrals of the Green's function. Finally, the impact of using the proposed models on the speed up of the computations required for the extraction process is demonstrated.