Test Socket Chip for Measuring Dark Current in IR FPA

Meng-Lieh Sheu; Tai-Ping Sun; Far-Wen Jih

doi:10.1109/DELTA.2002.994608

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Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002

Test Socket Chip for Measuring Dark Current in IR FPA

Year: 2002, Pages: 167

DOI Bookmark: 10.1109/DELTA.2002.994608

Authors

Meng-Lieh Sheu, National Chi-Nan University
Tai-Ping Sun, National Chi-Nan University
Far-Wen Jih, National Chi-Nan University

Abstract

A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated.

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