Advanced Search
CS Search Google Search
Subscribers, please login

Published Articles >> Table of Contents >> Abstract

Design, Automation and Test in Europe Conference and Exhibition (DATE'03)   p. 10674
Multi-Granularity Metrics for the Era of Strongly Personalized SOCs

Full Article Text: Download PDF of full textBuy this article

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10096
Send link to a friend

Abstract
This paper details the first step of the Design Trotter framework or design space exploration applied to dedicated SOCs. The aim of this step is to provide metrics in order to guide the designer and the synthesis tool towards an efficient application architecture matching. This work presents a computation of metrics at all levels of the application graph-based hierarchy. These metrics are computed through data and control dependency analysis. They quantify the memory, control and processing orientations as well as the average of parallelism for different granularities.
Additional Information

Citation:  Y. Le Moullec, N. Ben Amor, J-Ph. Diguet, M. Abid, J-L. Philippe, "Multi-Granularity Metrics for the Era of Strongly Personalized SOCs," date, p. 10674,  Design, Automation and Test in Europe Conference and Exhibition (DATE'03),  2003

Similar Articles

Abstract Contents
Abstract
Citation




Free access to

  • Abstracts
  • Selected PDFs

Electronic subscribers login to:

  • Access HTML/PDFs of full text articles

Subscription information

Get a Web account

PDFs require Adobe Acrobat Reader.

Peer Review Notice

Give us Feedback