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Published Articles >> Table of Contents >> Abstract
Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
p. 10230
A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis
Chunsheng Liu, Duke University
Krishnendu Chakrabarty, Duke University
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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10074
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| Abstract |
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We present a new partition-based fault diagnosis technique for identifying failing scan cells in a scan-BIST environment. This approach relies on a two-step scan chain partitioning scheme. In the first step, an interval-based partitioning scheme is used to generate a small number of partitions, where each element of a partition consists of a set of scan cells. In the second step, additional partitions are created using an earlier-proposed random-selection partitioning method. Two-step partitioning leads to higher diagnostic resolution than a scheme that relies only on random-selection partitioning, with only a small amount of additional hardware. The proposed scheme is especially suitable for a system-on-chip (SOC) composed of multiple embedded cores, where test access is provided by means of a TestRail that is threaded through the internal scan chains of the embedded cores. We present experimental results for the six largest ISCAS-89 benchmark circuits and for two SOCs crafted from some of the ISCAS-89 circuits.
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 Additional Information
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Citation:
Chunsheng Liu, Krishnendu Chakrabarty,
"A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis,"
date,
p. 10230,
Design, Automation and Test in Europe Conference and Exhibition (DATE'03),
2003
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