Abstract
A new Built-In Self Test (BIST) scheme that can be used for both off-line production and periodic testing of delay faults as well as for concurrent detection of faults causing signal delays in the field is presented. The scheme is based on the IDDT monitoring of the outputs of the circuit under test (CUT) or functional circuit. The proposed scheme has minimal impact on the performance and silicon area of the design since the same response verifier circuit is used for both off-line and concurrent detection of errors in the field.