Proceedings. Twenty-Third Annual International Computer Software and Applications Conference (Cat. No.99CB37032)
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Abstract

This paper describes an AI planner assisted approach to generate test cases for system testing based on high level test objectives. Test generation is based on an extended UML model of the system under test and a mapping of high-level test objectives into initial and goal conditions of the planner. We illustrate the use of this approach on a series of high level test objectives one might apply to a robot controlled tape silo.
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