Abstract
To implement the complicated functionality, the number of required embedded memory cores in a system-on-chip (SOC) is growing more and more. How to reduce the testing time of the multiple memory cores under the power constraint of SOC becomes an important issue. Based on the march elements of the march algorithms, an effective method for the embedded memory core test scheduling is presented in this paper. Without losing the memory testing functionality, the march elements of a march algorithm can be performed consecutively by distinct test resources. This gives a great flexibility in the proposed march element based test scheduling method to reduce the overall testing time of the multiple memory cores. To reduce the total testing cost, appropriate resources should be considered in the test scheduling. In this paper, several experiments have shown that the utilization of test resources and testing time reduction by using the proposed method.