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11th Asian Test Symposium (ATS'02)   p. 39
Test Limitations of Parametric Faults in Analog Circuits
Jacob Savir, New Jersey Institute of Technology
Zhen Guo, New Jersey Institute of Technology

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181682
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Abstract
This paper investigates the detectability of parameter faults in linear, time-invariant, analog circuits. We show that there are inherent limitations with regard to analog faults detectability.
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Citation:  Jacob Savir, Zhen Guo, "Test Limitations of Parametric Faults in Analog Circuits," ats, p. 39,  11th Asian Test Symposium (ATS'02),  2002