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Fourth Asian Test Symposium (ATS'95)   p. 303
Error masking in compact testing based on the Hamming code and its modifications
S. Demidenko, Singapore Polytech., Singapore
A. Ivanyukovich, Singapore Polytech., Singapore
L. Makhist, Singapore Polytech., Singapore
V. Piuri, Singapore Polytech., Singapore

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DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485352
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Abstract
Probability that an invalid sequence at an output of a device under test is not detected (error masking) is the measure of the effectiveness of compact testing methods. This paper evaluates and analyses the probability distribution of error masking for compact testing by exploiting the characteristics both of the Hamming code (i.e., the signature analysis) and of some modified Hamming codes. To study the effectiveness of these methods we derive also the analytical expressions for the number of code words of arbitrary weight. Finally, bounds for error masking probability are obtained.
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Index Terms- Hamming codes; binary sequences; logic testing; probability; error masking; compact testing; Hamming code; invalid sequence; probability distribution; signature analysis; code words; arbitrary weight; masking probability Citation:  S. Demidenko, A. Ivanyukovich, L. Makhist, V. Piuri, "Error masking in compact testing based on the Hamming code and its modifications," ats, p. 303,  Fourth Asian Test Symposium (ATS'95),  1995