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Published Articles >> Table of Contents >> Abstract
Seventh Asia-Pacific Software Engineering Conference (APSEC'00)
p. 356
Tailoring test process by using the component-based development paradigm and the XML technology
Jooyoung Seo, Dept. of Comput. Sci. & Eng., Ewha Woman's Univ., Seoul, South Korea
Byoungju Choi, Dept. of Comput. Sci. & Eng., Ewha Woman's Univ., Seoul, South Korea
Full Article Text:
 
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/APSEC.2000.896720
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| Abstract |
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ISO (International Standardization Organization) and the IEC (International Electrotechnical Commission) provide numerous standards for software products and processes. Utilizing those standards specific to a project requires some tailoring to meet the development domain. This paper includes: (1) a test process meta-model, which is a test process defined in standards; (2) "a scheme for tailoring processes" following a component-based development customization technique; and (3) AutoTP, an "automation tool for tailoring", which is derived from XML techniques. AutoTP is a tool in which a standard test process automatically generates a tailored test process by means of a methodology and a domain. In addition, the Rational Objectory process is used as an empirical study in this paper.
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Additional Information
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Index Terms- program testing; software process improvement; software standards; subroutines; ISO standards; IEC standards; hypermedia markup languages; software tools; computer aided software engineering; software test process customization; component-based development paradigm; XML technology; ISO; IEC; software products; software processes; project-specific standards; test process meta-model; process tailoring scheme; component-based development customization technique; AutoTP; automation tool; Rational Objectory process; Extensible Markup Language
Citation:
Jooyoung Seo, Byoungju Choi,
"Tailoring test process by using the component-based development paradigm and the XML technology,"
apsec,
p. 356,
Seventh Asia-Pacific Software Engineering Conference (APSEC'00),
2000
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